Ключевые слова: HTS, YBCO, coated conductors, fabrication, co-evaporation process, presentation, critical current, critical caracteristics
Kim H.S., Youm D., Yoo J., Ha H.S., Ha D.W., Song K.J., Ko R.K., Oh S., Lee N.J., Moon S.H., Yoo S.I., Yang J.S., Kim T.H., Kim H.K., Ko K.P., Yu K.K.
Ключевые слова: HTS, REBCO, coated conductors, RABITS process, IBAD process, co-evaporation process, long conductors, fabrication, composition, microstructure, critical current density, oxygenation treatments, heat treatment, current-voltage characteristics, Jc/B curves, YBCO, PLD process, angular dependence, presentation, critical caracteristics
Lee H.G., Jo W., Hammond R.H., Beasley M.R., Hong G.W., Yoon H.R., Lee R., Cheong H., Yoon S., Huh J.U.
Ginocchio S., Zannella S., Bindi M., Gauzzi A., Rampino S., Gilioli E., Baldini M., Bissoli F., Pattini F.
Kim H.S., Park C., Oh S.S., Ha D.W., Song K.J., Ko R.K., Joo J.H., Moon S.H., Yoo S.I., Yang J.S., Kim H.K., Ha H.S.*21, Jung Y.H., Yoo K.K., Youm D.J.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, electron beam evaporation, co-evaporation process, composition, substrate cylindrical, fabrication
Jo W.(wmjo@ewha.ac.kr)
Gianni L., Zannella S., Gauzzi A., Rampino S., Bindi M.(massimiliano.bindi@edison.it), Canetti M., Gangini F., Gilioli E.
Ключевые слова: HTS, YBCO, coated conductors, co-evaporation process, reel-to-reel process, fabrication
Ginocchio S., Zannella S., Bindi M., Gauzzi A., Rampino S., Gilioli E., Baldini M., Bissoli F., Pattini F.
Ключевые слова: HTS, coated conductors, co-evaporation process, buffer layers, substrate Ni-W, oxygenation treatments, fabrication
Ключевые слова: HTS, YBCO, substrate NbN/Si, buffer layers, co-evaporation process, fabrication, texture, microstructure, critical current, critical caracteristics
Ma B., Koritala R.E., Fisher B.L., Dorris S.E., Miller D.J., Balachandran U., Maroni V.A., Uprety K.K.
Ключевые слова: HTS, YBCO, coated conductors, mechanical strain, mechanical properties, substrate CeO2/IBAD-YSZ/Ni alloy, ISD process, buffer layers, REBCO, co-evaporation process, protection layer Au, critical current, bending process, stress effects, microstructure, experimental results, critical caracteristics, fabrication
Goyal A., Paranthaman M., Leonard K.J., Sathyamurthy S., Kroeger D.M., Lee D.F.(leedf@ornl.gov), Jr L.H., Yoo J., List F.A., Rutter N., Cook S.W., Martin P.M.
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.